Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
| Author | : | |
| Rating | : | 4.90 (887 Votes) |
| Asin | : | 3540135308 |
| Format Type | : | paperback |
| Number of Pages | : | 457 Pages |
| Publish Date | : | 2014-03-04 |
| Language | : | English |
DESCRIPTION:
It is an inspiring book for beginners and experienced SEM operators alike. "this book is both linguistically and scientifically outstanding. The list of references is especially useful. 11, No12, December 2000. This volume makes an outstanding contribution to the deeper understanding of the SEM." T Mulvey, Measurement Science and Technology
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.